Applied econometrics : a modern approach using EViews and Microfit; Dimitrios Asteriou; 2007
Begagnad
Applied econometrics : a modern approach using EViews and Microfit; Dimitrios Asteriou; 2007
Begagnad

Applied econometrics : a modern approach using EViews and Microfit

av Dimitrios Asteriou

  • Utgiven: 2007
  • ISBN: 9780230506404
  • Sidor: 424 st
  • Förlag: New York, N.Y. Palgrave Macmillan
  • Format: Häftad
  • Språk: Engelska

Om boken

This new revised edition of Applied Econometrics is an ideal text for students who are looking for a reliable and practical grounding in the subject. Students are introduced to the various forms of econometric data and how they are formatted in electronic media, and shown how to transfer and use the data in the most popular software packages. Each chapter begins with a clear theoretical overview followed by a step-by-step approach to using the software. Mathematics has been kept to a minimum but when used is accompanied by helpful expanations. The book is accompanied by a website www.palgrave.com/economics/asteriou/data.htm that includes all the necessary files for reproduction of all the econometric work that is carried out throughout the text.

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Mer om Applied econometrics : a modern approach using EViews and Microfit (2007)

2007 släpptes boken Applied econometrics : a modern approach using EViews and Microfit skriven av Dimitrios Asteriou. Den är skriven på engelska och består av 424 sidor. Förlaget bakom boken är New York, N.Y. Palgrave Macmillan.

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Referera till Applied econometrics : a modern approach using EViews and Microfit

Harvard

Asteriou, D. (2007). Applied econometrics : a modern approach using EViews and Microfit. New York, N.Y. Palgrave Macmillan.

Oxford

Asteriou, Dimitrios, Applied econometrics : a modern approach using EViews and Microfit (New York, N.Y. Palgrave Macmillan, 2007).

APA

Asteriou, D. (2007). Applied econometrics : a modern approach using EViews and Microfit. New York, N.Y. Palgrave Macmillan.

Vancouver

Asteriou D. Applied econometrics : a modern approach using EViews and Microfit. New York, N.Y. Palgrave Macmillan; 2007.